The hitachi 3400n vpsem is a scanning electron microscope with tungsten filament allowing accelerating voltages up to 30kv. The s3400n will be a new world standard in the middle class variable. Scanning electron microscope s3400n hitech instruments sdn. Lower the magnification all the way mag knob ccw until it beeps. Like s3400n, the new s3700n features hitachis high imaging performance, e. The new hitachi s3400n variable pressure sem has been developed by improving the design of the s3000n vp sem which has been well accepted in the world market. Live color cathodoluminescence imaging of geological. Hitachi model s3400n variablepressure sem specifications. A new analytical chamber provides high take off angle ports for eds and ebsd. The s3400n is a powerful userfriendly sem through newly developed electron optical and automated functions by hitachi.
The s 3400n main unit from hitachi instruction manual. This scope is beautiful and clean and was well maintained. Image files should not be renamed or deleted by using. Hitachi ion milling system example application data flat milling grinding flaws and smearing from mechanical polishing can easily be removed by the im4000. Pci is available on other computers in the main lab. The new hitachi s3400n variable pressure sem has been developed by improving the design of. Enter your complete name, cmrf user code, date, the starting clock time, and the starting beam time into the record book. The scanning electron microscope is an ideal tool in which to demonstrate this effect on small areas of samples. It allows the study of wet, oily, andor nonconductive samples without metal coating or other complicated specimen preparation techniques. Sap beetle our hitachi sem 3400n is equipped with a turbomolecular pump for quick pump down times. A bse detector allows tv rate scanning and high resolution imaging. Ensure the scan speed is set to fast 1 in the top left part of the screen. When you reach the sem the sem and computer will be on. The slow 1 scan speed will help when viewing the sample in these modes.
Variable chamber pressure allows chargeup free observation of any sample without. Sem user files\ groups here \ your own named folder. Further fine adjustment controls are on the manual dial panel. Hitachi vpsem s3400n national metallurgical laboratory. New scanning electron microscope model s3700n is released. Insert stub onto specimen holder and tighten set screw. Live color cathodoluminescence imaging of geological specimens in the sem using the hitachi s3400n sem cathodoluminescence cl occurs when an electron beam strikes a material and causes it to luminesce. Rearrange individual pages or entire files in the desired order. Tem jeol, jem2010 pdf fishione plasma cleaner, em sample cleaning ekstern lenke. There are 3 pieces involved in the sample holder, 2 are shown. The s3400n offers advances in automation including full filament saturation and no touch objective aperture alignment. The new hitachi s3400n variable pressure sem has been developed by.
The new hitachi s3400n variable pressure sem has been developed by improving the design of the. Open the scanning electron microscope with a key switch, twist from the off position to the start file, the key to on automatically playing files. Log in with your log in name and password when s3400n dialog window opens. If you save the pci version of the file you can edit your images or take measurements later. The hitachi 3400n is a workhorse low vacuum capable tungsten sem. Always wear gloves when handling anything that goes in the chamberstubs, specimens, sample holders etc. The excellent image quality convinces at high and low beam energies, and optimized detector technology provides maximum information from sample. Opening the chamber to load specimens this may also be done later using the software 1. Hitachi s3400n scanning electron microscope hebei north. Operationmaintenance edition 2 electron optical column sectional view of the s 3400n column from hitachi instruction manual.
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